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Ships within 48 hours · Estimated delivery Aug 18 - Aug 23
as required by international quality standards such as ISO
Magnetic Force Microscopy Sample
Built on the high-performance RFESP-75 AFM probe
Completely Gold Coated
Unmounted for use on standard AFM's
MRS-6 Magnification Reference Standard 1,500x - 1,000,000x - Adapter 5B as required by international qualityDESCRIPTION Retainer & Mounting MRS 6 on standard commonly used 1 2" (12. 7mm) pin stub with 1 8" (3. 2mm) pin Retainer & Mounting MRS 6 on Hitachi 15mm x 6mm stub 0. 08, 0. 1, 0. 2, 0. 5, 1, and 2m PITCH PATTERNS 3 BAR PATTERNS from . 08 TO 3m 1M PITCH TEST GRID X 20m 3 NM INDIVIDUAL PITCH 2 UNCERTAINTY! 2NM CUMULATIVE PITCH 2 UNCERTAIN This is the next generation, NIST and NPL (NIST counterpart in the U. K.) Traceable, Magnification Reference
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