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The excellent thermal and electrical conductivity
Theseprobes also have a tip radius (< 20 nm) which is difficult toroutinely obtain by standard AFM probe processing methods
The cavity allows for a maximum specimen height of 3
Since the standard is made on quartz
There is a mutual recognition agreement between NIST and NPL recognizing each others' measurements
FIB2-100A Nickel The excellent thermal and electrical42N m, 320kHz, 10nm Tip Radius, 100nm Wide Spike @ 2m, Al reflective coating DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS 42N m, 320kHz, 10nm Tip Radius, 100nm Wide Spike @ 2m, Al reflective coating High aspect ratio probe based upon Bruker technology and made from our TESP. Aspect ratio of 20: 1 at 2um from tip apex. Tip Geometry: High Aspect Ratio Tip Height: 10 15 Front Angle: 1 0. 5 Back Angle: 1 0. 5 Side Angle: 1 0. 5 Tip Radius
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