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APSH-0050 Automated AFM 8N/m spring constant

SKU: 92505766819

4.4
USD460.38 USD509.38

Pay in 4 interest-free payments of $115.09 Learn more

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Ships within 48 hours · Estimated delivery Aug 20 - Aug 25

Description

8N/m spring constant

High quality probe manufactured at Bruker AFM Probes

Recommended for Dimension SPM

Max EL = 500 nm

55 Cantilever Thickness (RNG): 0

APSH-0050 Automated AFM 8N/m spring constantCP II sample bias holder DESCRIPTION Sample bias holder for CPII Innova has connectors to apply an external sample bias voltage. This type of sample holder is used to hold a flat sample, such as a piece of semiconductor material. The Sample Bias Holder is included in the Scanning Capacitance Microscopy (SCM) option.

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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