ESP-V2 Carbon Coated Tip Geometry: Critical Dimension (Overhang)

Tip Geometry: Critical Dimension (Overhang) Tip Height: 10 - 20 Tip Set Back( RNG): 5 - 15 Tilt Compensation: cell2

preventing moisture from entering the head during fluid scanning

A pack of 10 High quality etched silicon probes for soft TappingMode™imaging and force modulation in air

Unmounted for use on standard AFM's

The Sample Bias Holder is included in the Scanning Capacitance Microscopy (SCM) option

ESP-V2 Carbon Coated Tip Geometry: Critical Dimension (Overhang)0. 2N m, 13kHz, 4 Sided Tip, No Reflex Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for contact mode imaging in air. Unmounted for use on standard AFM's. Bruker AFM Probes has introduced an improved version of its popular, ESP ESPA AFM probes. Brukers new line of ESP high quality premiumetched silicon probes set the industry standard for contact mode in air. The new design