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Optical Microscopy: reflected
and afm+ for CAFM measurements and contact mode imaging
7mm) pin stub with 1/8" (3
The wide rims (350-400µm) on the PELCO® Grids provide additional stiffness and minimize the potential of interfering with the sample when picking up and handling the grids with tweezers
and 2µm PITCH PATTERNS
SiC-STEP Calibration Samples Step Height:0.75nm Optical Microscopy: reflectedDESCRIPTION 6H SiC (0001) based calibration sample which is designed to perform easy calibrations of an AFM scanner's vertical movements in several nanometers interval. The simplicity of calibration of the calibration process is provided by the nearly uniform distribution of half monolayer high steps (either 0. 75 or 1. 5nm) on the sample surface demonstrating both chemical and mechanical stability. The step height corresponds to the half of the
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