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the structure symmetry makes it possible to calibrate your AFM system without the need to rotate and realign the sample in-between X- and Y-axis calibration
The reflex side of the cantilever has a Co-Cr coating for increased reflectivity up to 2
5mm with a thickness of 675µm ±10µm
it saves time and it avoids introduction of preparation artifacts
025 Ocm Antimony (n) doped Si Cantilever Thickness (Nom): 2
Low Profile Metallographic Mount Holder Size:1-1/2" and 38-40mm the structure symmetry makes itDESCRIPTION SEM Pin Mount Specimen Holdersfor Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain
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