Pay in 4 interest-free payments of $48.40 Learn more
Ships within 48 hours · Estimated delivery Oct 12 - Oct 17
and PF TUNA packages
These probesare ideal for C-AFM
Applications for the PELCO® Pro Gold Plated Tweezers include microelectronics
The legacy MESP-HM is still available for ordering while supplies last
16068 - Glue Gun
Critical Dimension (CD) Calibration Test Specimens for SEM, FIB, and AFM Type:Non-Certified and PF TUNA packagesDESCRIPTION "Critical Dimension (CD) structures" are particularly useful for SEM FIB magnification calibration and may be used for AFM. Microscopists and engineers using high performance SEMs or FIB systems will find this calibration test specimen useful. The 4. 8 x 4. 8mm silicon standard has a series of patterns with a side length of 480m around its edges, helpful for orientation. There are three versions available. Version with a 10 5 2 1 0. 5um
US$ 13.99
US$ 24.99
US$ 54.99
